Effects of oxygen-related traps in silicon on the generation-recombination noise
- Tejada, JAJ
- Villanueva, JAL
- Godoy, A
- Carceller, JE
- Gomez-Campo, FM
- Rodriguez-Bolivar, S
- Gonzalez, T (coord.)
- Mateos, J (coord.)
- Pardo, D (coord.)
ISSN: 0094-243X
ISBN: 0-7354-0267-1
Year of publication: 2005
Volume: 780
Pages: 717-720
Congress: 18th International Conference on Noise and Fluctuations
Type: Conference paper