Effects of oxygen-related traps in silicon on the generation-recombination noise

  1. Tejada, JAJ
  2. Villanueva, JAL
  3. Godoy, A
  4. Carceller, JE
  5. Gomez-Campo, FM
  6. Rodriguez-Bolivar, S
Collection de livres:
Noise and Fluctuations
  1. Gonzalez, T (coord.)
  2. Mateos, J (coord.)
  3. Pardo, D (coord.)

ISSN: 0094-243X

ISBN: 0-7354-0267-1

Année de publication: 2005

Volumen: 780

Pages: 717-720

Congreso: 18th International Conference on Noise and Fluctuations

Type: Communication dans un congrès

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La source de données: WoS