Contribution of the carrier number fluctuation and mobility fluctuation on the RTS amplitude in submicron n-MOSFETs.
- Godoy, A
- Palma, A
- Gamiz, F
- Jimenez-Tejada, JA
- Cartujo, P
- Claeys, C (coord.)
- Simoen, E (coord.)
ISBN: 981-02-3141-5
Datum der Publikation: 1997
Seiten: 201-204
Kongress: 14th International Conference on Noise in Physical Systems and l/f Fluctuations (ICNF 97)
Art: Konferenz-Beitrag