Contribution of the carrier number fluctuation and mobility fluctuation on the RTS amplitude in submicron n-MOSFETs.

  1. Godoy, A
  2. Palma, A
  3. Gamiz, F
  4. Jimenez-Tejada, JA
  5. Cartujo, P
Libro:
NOISE IN PHYSICAL SYSTEMS AND 1/F FLUCTUATIONS, PROCEEDINGS OF THE 14TH INTERNATIONAL CONFERENCE
  1. Claeys, C (coord.)
  2. Simoen, E (coord.)

ISBN: 981-02-3141-5

Ano de publicación: 1997

Páxinas: 201-204

Congreso: 14th International Conference on Noise in Physical Systems and l/f Fluctuations (ICNF 97)

Tipo: Achega congreso

GOOGLE SCHOLAR
Fonte de datos: WoS