Dielectric nanotomography based on electrostatic force microscopy: A numerical analysis

  1. Fabregas, R.
  2. Gomila, G.
Journal:
Journal of Applied Physics

ISSN: 1089-7550,  0021-8979

Year of publication: 2020

Volume: 127

Issue: 2

Type: Article

DOI: 10.1063/1.5122984 GOOGLE SCHOLAR
Data source: Scopus