Dielectric nanotomography based on electrostatic force microscopy: A numerical analysis
- Fabregas, R.
- Gomila, G.
ISSN: 1089-7550, 0021-8979
Argitalpen urtea: 2020
Alea: 127
Zenbakia: 2
Mota: Artikulua
Aldizkaria:
Journal of Applied Physics