Consecutive Irradiation and Thermal Annealing of Commercial P-Channel Power VDMOSFETs
- Mitrovic, N.
- Guirado, D.
- Dankovic, D.
- Palma, A.J.
- Ristic, G.
- Carvajal, M.A.
Konferenzberichte:
2023 IEEE 33rd International Conference on Microelectronics, MIEL 2023
ISBN: 9798350347760
Datum der Publikation: 2015
2023 IEEE 33rd International Conference on Microelectronics, MIEL 2023
Art: Konferenz-Beitrag