Consecutive Irradiation and Thermal Annealing of Commercial P-Channel Power VDMOSFETs

  1. Mitrovic, N.
  2. Guirado, D.
  3. Dankovic, D.
  4. Palma, A.J.
  5. Ristic, G.
  6. Carvajal, M.A.
Proceedings:
2023 IEEE 33rd International Conference on Microelectronics, MIEL 2023

ISBN: 9798350347760

Year of publication: 2015

2023 IEEE 33rd International Conference on Microelectronics, MIEL 2023

Type: Conference paper

DOI: 10.1109/MIEL58498.2023.10315908 GOOGLE SCHOLAR
Data source: Scopus