The mystery ofthe Z<SUP>2</SUP>-FET 1 T-DRAM memory

  1. Bawedin, M.
  2. El Dirani, H.
  3. Lee, K.
  4. Parihar, M. S.
  5. Lacord, J.
  6. Martinie, S.
  7. Le Royer, C.
  8. Barbe, J. -Ch.
  9. Mescot, X.
  10. Fonteneau, P.
  11. Galy, Ph.
  12. Gamiz, F.
  13. Navarro, C.
  14. Cheng, B.
  15. Asenov, A.
  16. Taur, Y.
  17. Cristoloveanu, S.
Book Series:
2017 JOINT INTERNATIONAL EUROSOI WORKSHOP AND INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON (EUROSOI-ULIS 2017)
  1. Sarafis, P (coord.)
  2. Nassiopoulou, AG (coord.)

ISSN: 2330-5738

ISBN: 978-1-5090-5313-1

Year of publication: 2017

Pages: 51-52

Congress: 3rd Joint International EUROSOI Workshop / International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)

Type: Conference paper