MSDRAM, A2RAM and Z<SUP>2</SUP>-FET performance benchmark for 1T-DRAM applications
- Lacord, Joris
- Parihar, Mukta Singh
- Navarro, Carlos
- Wakam, Francois Tcheme
- Bawedin, Maryline
- Cristoloveanu, Sorin
- Gamiz, Fransisco
- Barbe, Jean-Charles
ISSN: 1946-1569
ISBN: 978-1-5386-6790-3
Ano de publicación: 2018
Páxinas: 198-201
Congreso: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
Tipo: Achega congreso