Influence of source-drain engineering and temperature on split-capacitance characteristics of FDSOI p-i-n gated diodes
- Sasaki, K. R. A.
- Navarro, C.
- Bawedin, M.
- Andrieu, F.
- Martino, J. A.
- Cristoloveanu, S.
Livre:
2016 IEEE SOI-3D-SUBTHRESHOLD MICROELECTRONICS TECHNOLOGY UNIFIED CONFERENCE (S3S)
ISBN: 978-1-5090-4391-0
Année de publication: 2016
Congreso: IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)
Type: Communication dans un congrès