Back-gate effects and mobility characterization in junctionless transistor

  1. Parihar, M.S.
  2. Liu, F.
  3. Navarro, C.
  4. Barraud, S.
  5. Bawedin, M.
  6. Ionica, I.
  7. Kranti, A.
  8. Cristoloveanu, S.
Aldizkaria:
Solid-State Electronics

ISSN: 0038-1101

Argitalpen urtea: 2016

Alea: 125

Orrialdeak: 154-160

Mota: Artikulua

DOI: 10.1016/J.SSE.2016.07.016 GOOGLE SCHOLAR