CMOS VT characterization by capacitance measurements in FDSOI PIN gated diodes

  1. Navarro, C.
  2. Bawedin, M.
  3. Andrieu, F.
  4. Cluzel, J.
  5. Garros, X.
  6. Cristoloveanu, S.
Proceedings:
European Solid-State Device Research Conference

ISSN: 1930-8876

ISBN: 9781479943784

Year of publication: 2014

Pages: 405-408

Type: Conference paper

DOI: 10.1109/ESSDERC.2014.6948846 GOOGLE SCHOLAR
Data source: Scopus