CMOS VT characterization by capacitance measurements in FDSOI PIN gated diodes

  1. Navarro, C.
  2. Bawedin, M.
  3. Andrieu, F.
  4. Cluzel, J.
  5. Garros, X.
  6. Cristoloveanu, S.
Actes de conférence:
European Solid-State Device Research Conference

ISSN: 1930-8876

ISBN: 9781479943784

Année de publication: 2014

Pages: 405-408

Type: Communication dans un congrès

DOI: 10.1109/ESSDERC.2014.6948846 GOOGLE SCHOLAR
La source de données: Scopus