Publicaciones en colaboración con investigadores/as de IEEE Computer Society (2)

2001

  1. Improving strained-Si on Si 1-xGe x deep submicron MOSFETs performance by means of a stepped doping profile

    IEEE Transactions on Electron Devices, Vol. 48, Núm. 9, pp. 1878-1884

1997

  1. Effects of the inversion layer centroid on MOSFET behavior

    IEEE Transactions on Electron Devices, Vol. 44, Núm. 11, pp. 1915-1922