JUAN ELOY
RUIZ CASTRO
CATEDRÁTICO DE UNIVERSIDAD
Technion – Israel Institute of Technology
Haifa, IsraelTechnion – Israel Institute of Technology-ko ikertzaileekin lankidetzan egindako argitalpenak (1)
2020
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Reversible dielectric breakdown in h-BN stacks: A statistical study of the switching voltages
IEEE International Reliability Physics Symposium Proceedings