Publicacións en colaboración con investigadores/as de KU Leuven (2)

2012

  1. Dependence of generation-recombination noise with gate voltage in FD SOI MOSFETs

    IEEE Transactions on Electron Devices, Vol. 59, Núm. 10, pp. 2780-2786

2010

  1. Modeling impact of electric field and strain on the leakage of embedded SiGe source/drain junctions

    2010 Proceedings of the European Solid State Device Research Conference, ESSDERC 2010