Publicaciones en colaboración con investigadores/as de Massachusetts Institute of Technology (4)

2020

  1. Reversible dielectric breakdown in h-BN stacks: A statistical study of the switching voltages

    IEEE International Reliability Physics Symposium Proceedings

2010

  1. WCE 2010 - World Congress on Engineering 2010: Preface

    WCE 2010 - World Congress on Engineering 2010

  2. WCE 2010 - World Congress on Engineering 2010: Preface

    WCE 2010 - World Congress on Engineering 2010