Soft error rate comparison of 6T and 8T SRAM ICs using mono-energetic proton and neutron irradiation sources

  1. Malagón, D.
  2. Bota, S.A.
  3. Torrens, G.
  4. Gili, X.
  5. Praena, J.
  6. Fernández, B.
  7. Macías, M.
  8. Quesada, J.M.
  9. Sanchez, C.G.
  10. Jiménez-Ramos, M.C.
  11. García López, J.
  12. Merino, J.L.
  13. Segura, J.
Revue:
Microelectronics Reliability

ISSN: 0026-2714

Année de publication: 2017

Volumen: 78

Pages: 38-45

Type: Révision

DOI: 10.1016/J.MICROREL.2017.07.093 GOOGLE SCHOLAR