Meta-heuristics for circuit partitioning in parallel test generation
- Gil, C.
- Ortega, J.
- Díaz, A.F.
- Montoya, M.G.
ISSN: 1611-3349, 0302-9743
ISBN: 9783540643593
Year of publication: 1998
Volume: 1388
Pages: 315-323
Type: Conference paper
ISSN: 1611-3349, 0302-9743
ISBN: 9783540643593
Year of publication: 1998
Volume: 1388
Pages: 315-323
Type: Conference paper