Theoretical characterisation of point defects on a MoS2 monolayer by scanning tunnelling microscopy

  1. González, C.
  2. Biel, B.
  3. Dappe, Y.J.
Aldizkaria:
Nanotechnology

ISSN: 1361-6528,  0957-4484

Argitalpen urtea: 2016

Alea: 27

Zenbakia: 10

Mota: Artikulua

DOI: 10.1088/0957-4484/27/10/105702 GOOGLE SCHOLAR
Datuen iturria: Scopus