Theoretical characterisation of point defects on a MoS2 monolayer by scanning tunnelling microscopy

  1. González, C.
  2. Biel, B.
  3. Dappe, Y.J.
Revue:
Nanotechnology

ISSN: 1361-6528,  0957-4484

Année de publication: 2016

Volumen: 27

Número: 10

Type: Article

DOI: 10.1088/0957-4484/27/10/105702 GOOGLE SCHOLAR
La source de données: Scopus