Memory Operation of Z²-FET without Selector at High Temperature

  1. Kwon, S.
  2. Navarro, C.
  3. Gamiz, F.
  4. Cristoloveanu, S.
  5. Kim, Y.-T.
  6. Ahn, J.
Journal:
IEEE Journal of the Electron Devices Society

ISSN: 2168-6734

Year of publication: 2021

Volume: 9

Pages: 658-662

Type: Article

DOI: 10.1109/JEDS.2021.3094104 GOOGLE SCHOLAR lock_openOpen access editor
Data source: Scopus