Active radiation-hardening strategy in bulk FinFETs

  1. Calomarde, A.
  2. Rubio, A.
  3. Moll, F.
  4. Gamiz, F.
Revue:
IEEE Access

ISSN: 2169-3536

Année de publication: 2020

Volumen: 8

Pages: 201441-201449

Type: Article

DOI: 10.1109/ACCESS.2020.3035974 GOOGLE SCHOLAR lock_openAccès ouvert editor
La source de données: Scopus