A thorough study of Si nanowire FETs with 3D Multi-Subband Ensemble Monte Carlo simulations

  1. Donetti, L.
  2. Sampedro, C.
  3. Ruiz, F.G.
  4. Godoy, A.
  5. Gamiz, F.
Aldizkaria:
Solid-State Electronics

ISSN: 0038-1101

Argitalpen urtea: 2019

Alea: 159

Orrialdeak: 19-25

Mota: Artikulua

DOI: 10.1016/J.SSE.2019.03.044 GOOGLE SCHOLAR