Impact of the trap attributes on the gate leakage mechanisms in a 2D MS-EMC nanodevice simulator
- Medina-Bailon, C.
- Sadi, T.
- Sampedro, C.
- Padilla, J.L.
- Donetti, L.
- Georgiev, V.
- Gamiz, F.
- Asenov, A.
ISSN: 1611-3349, 0302-9743
ISBN: 9783030106911
Année de publication: 2019
Volumen: 11189 LNCS
Pages: 273-280
Type: Communication dans un congrès