Impact of Strain on S/D tunneling in FinFETs: A MS-EMC study

  1. Medina-Bailon, C.
  2. Sampedro, C.
  3. Padilla, J.L.
  4. Godoy, A.
  5. Donetti, L.
  6. Georgiev, V.P.
  7. Gamiz, F.
  8. Asenov, A.
Proceedings:
International Conference on Simulation of Semiconductor Processes and Devices, SISPAD

ISBN: 9781538667880

Year of publication: 2018

Volume: 2018-September

Pages: 301-304

Type: Conference paper

DOI: 10.1109/SISPAD.2018.8551707 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus