Impact of Strain on S/D tunneling in FinFETs: A MS-EMC study
- Medina-Bailon, C.
- Sampedro, C.
- Padilla, J.L.
- Godoy, A.
- Donetti, L.
- Georgiev, V.P.
- Gamiz, F.
- Asenov, A.
Actes de conférence:
International Conference on Simulation of Semiconductor Processes and Devices, SISPAD
ISBN: 9781538667880
Année de publication: 2018
Volumen: 2018-September
Pages: 301-304
Type: Communication dans un congrès