Source-to-drain tunneling analysis in FDSOI, DGSOI, and FinFET devices by means of multisubband ensemble Monte Carlo

  1. Medina-Bailon, C.
  2. Padilla, J.L.
  3. Sampedro, C.
  4. Godoy, A.
  5. Donetti, L.
  6. Gamiz, F.
Journal:
IEEE Transactions on Electron Devices

ISSN: 0018-9383

Year of publication: 2018

Volume: 65

Issue: 11

Pages: 4740-4746

Type: Article

DOI: 10.1109/TED.2018.2867721 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus