Coulomb scattering in high- κ gate stack silicon-on-insulator metal-oxide-semiconductor field effect transistors

  1. Jiḿnez-Molinos, F.
  2. Gámiz, F.
  3. Donetti, L.
Aldizkaria:
Journal of Applied Physics

ISSN: 0021-8979

Argitalpen urtea: 2008

Alea: 104

Zenbakia: 6

Mota: Artikulua

DOI: 10.1063/1.2975993 GOOGLE SCHOLAR

Objetivos de desarrollo sostenible

Datuen iturria: Scopus