A new remote Coulomb scattering model for ultrathin oxide MOSFETs

  1. Gámiz, F.
  2. Godoy, A.
  3. Roldán, J.B.
Actes de conférence:
International Conference on Simulation of Semiconductor Processes and Devices, SISPAD

ISBN: 0780378261

Année de publication: 2003

Volumen: 2003-January

Pages: 47-50

Type: Communication dans un congrès

DOI: 10.1109/SISPAD.2003.1233634 GOOGLE SCHOLAR
La source de données: Scopus