A new remote Coulomb scattering model for ultrathin oxide MOSFETs

  1. Gámiz, F.
  2. Godoy, A.
  3. Roldán, J.B.
Actas:
International Conference on Simulation of Semiconductor Processes and Devices, SISPAD

ISBN: 0780378261

Ano de publicación: 2003

Volume: 2003-January

Páxinas: 47-50

Tipo: Achega congreso

DOI: 10.1109/SISPAD.2003.1233634 GOOGLE SCHOLAR
Fonte de datos: Scopus