Effects of oxide-charge space correlation on electron mobility in inversion layers

  1. Gamiz, F.
  2. Melchor, I.
  3. Palma, A.
  4. Cartujo, P.
  5. Lopez-Villanueva, J.A.
Journal:
Semiconductor Science and Technology

ISSN: 0268-1242

Year of publication: 1994

Volume: 9

Issue: 5

Pages: 1102-1107

Type: Article

DOI: 10.1088/0268-1242/9/5/015 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus