Effects of gate oxide and junction nonuniformity on the DC and low-frequency noise performance of four-gate transistors

  1. Jiménez Tejada, J.A.
  2. Luque Rodríguez, A.
  3. Godoy, A.
  4. Rodríguez-Bolívar, S.
  5. López Villanueva, J.A.
  6. Marinov, O.
  7. Deen, M.J.
Journal:
IEEE Transactions on Electron Devices

ISSN: 0018-9383

Year of publication: 2012

Volume: 59

Issue: 2

Pages: 459-467

Type: Article

DOI: 10.1109/TED.2011.2176494 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus