Effects of gate oxide and junction nonuniformity on the DC and low-frequency noise performance of four-gate transistors
- Jiménez Tejada, J.A.
- Luque Rodríguez, A.
- Godoy, A.
- Rodríguez-Bolívar, S.
- López Villanueva, J.A.
- Marinov, O.
- Deen, M.J.
ISSN: 0018-9383
Année de publication: 2012
Volumen: 59
Número: 2
Pages: 459-467
Type: Article