Surface roughness scattering model for arbitrarily oriented silicon nanowires

  1. Tienda-Luna, I.M.
  2. Ruiz, F.G.
  3. Godoy, A.
  4. Biel, B.
  5. Gmiz, F.
Journal:
Journal of Applied Physics

ISSN: 0021-8979

Year of publication: 2011

Volume: 110

Issue: 8

Type: Article

DOI: 10.1063/1.3656026 GOOGLE SCHOLAR
Data source: Scopus