Surface roughness scattering model for arbitrarily oriented silicon nanowires
- Tienda-Luna, I.M.
- Ruiz, F.G.
- Godoy, A.
- Biel, B.
- Gmiz, F.
Revue:
Journal of Applied Physics
ISSN: 0021-8979
Année de publication: 2011
Volumen: 110
Número: 8
Type: Article