A model for the generation recombination noise in junction field effect structures: Application to four-gate transistors

  1. Jiménez Tejada, J.A.
  2. Rodríguez, A.L.
  3. Godoy, A.
Proceedings:
AIP Conference Proceedings

ISSN: 0094-243X,  1551-7616

ISBN: 9780735404328

Year of publication: 2007

Volume: 922

Pages: 105-110

Type: Conference paper

DOI: 10.1063/1.2759646 GOOGLE SCHOLAR
Data source: Scopus