A model for the generation recombination noise in junction field effect structures: Application to four-gate transistors
- Jiménez Tejada, J.A.
- Rodríguez, A.L.
- Godoy, A.
ISSN: 0094-243X, 1551-7616
ISBN: 9780735404328
Année de publication: 2007
Volumen: 922
Pages: 105-110
Type: Communication dans un congrès