A comprehensive characterization of the threshold voltage extraction in MOSFETs transistors based on smoothing splines

  1. Ibáñez, M.J.
  2. Roldán, J.B.
  3. Roldán, A.M.
  4. Yáñez, R.
Revue:
Mathematics and Computers in Simulation

ISSN: 0378-4754

Année de publication: 2014

Volumen: 102

Pages: 1-10

Type: Article

DOI: 10.1016/J.MATCOM.2013.04.024 GOOGLE SCHOLAR
La source de données: Scopus