A comprehensive characterization of the threshold voltage extraction in MOSFETs transistors based on smoothing splines

  1. Ibáñez, M.J.
  2. Roldán, J.B.
  3. Roldán, A.M.
  4. Yáñez, R.
Revista:
Mathematics and Computers in Simulation

ISSN: 0378-4754

Ano de publicación: 2014

Volume: 102

Páxinas: 1-10

Tipo: Artigo

DOI: 10.1016/J.MATCOM.2013.04.024 GOOGLE SCHOLAR
Fonte de datos: Scopus