Test pattern generation for analog circuits using neural networks and evolutive algorithms
- Bernier, J.L.
- Merelo, J.J.
- Ortega, J.
- Prieto, A.
ISSN: 1611-3349, 0302-9743
ISBN: 9783540594970
Year of publication: 1995
Volume: 930
Pages: 838-844
Type: Conference paper