Test pattern generation for analog circuits using neural networks and evolutive algorithms

  1. Bernier, J.L.
  2. Merelo, J.J.
  3. Ortega, J.
  4. Prieto, A.
Collection de livres:
Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

ISSN: 1611-3349,  0302-9743

ISBN: 9783540594970

Année de publication: 1995

Volumen: 930

Pages: 838-844

Type: Communication dans un congrès

DOI: 10.1007/3-540-59497-3_258 GOOGLE SCHOLAR
La source de données: Scopus