A new algorithm for dynamic faults detection in RAMs

  1. Azimane, M.
  2. Majhi, A.
  3. Gronthoud, G.
  4. Lousberg, M.
  5. Eichenberger, S.
  6. Ruiz, A.L.
Proceedings:
Proceedings of the IEEE VLSI Test Symposium

ISBN: 9780769523149

Year of publication: 2005

Pages: 177-182

Type: Conference paper

DOI: 10.1109/VTS.2005.9 GOOGLE SCHOLAR
Data source: Scopus