Impact of device geometry of the fin Electron-Hole Bilayer Tunnel FET

  1. Alper, C.
  2. Padilla, J.L.
  3. Palestri, P.
  4. Ionescu, A.M.
Proceedings:
European Solid-State Device Research Conference

ISSN: 1930-8876

ISBN: 9781509029693

Year of publication: 2016

Volume: 2016-October

Pages: 307-310

Type: Conference paper

DOI: 10.1109/ESSDERC.2016.7599647 GOOGLE SCHOLAR
Data source: Scopus