Statistical supervised learning with engineering data: a case study of low frequency noise measured on semiconductor devices
- Gámiz, M.L.
- Kalén, A.
- Nozal-Cañadas, R.
- Raya-Miranda, R.
ISSN: 1433-3015, 0268-3768
Year of publication: 2022
Volume: 120
Issue: 9-10
Pages: 5835-5853
Type: Article