Dependence of the optical cross section of interface states on the photon energy at Si-SiO2 structures

  1. Herms, A.
  2. Morante, J.R.
  3. Samitier, J.
  4. Cornet, A.
  5. Cartujo, P.
  6. Lora-Tamayo, E.
Revue:
Surface Science

ISSN: 0039-6028

Année de publication: 1986

Volumen: 168

Número: 1-3

Pages: 665-671

Type: Article

DOI: 10.1016/0039-6028(86)90898-8 GOOGLE SCHOLAR