A model for the generation recombination noise in junction field effect structures application to four-gate transistors
- Tejada, J. A. Jimenez
- Rodriguez, A. Luque
- Godoy, A.
- Tacano, M (coord.)
- Yamamoto, Y (coord.)
- Nakao, M (coord.)
ISSN: 0094-243X
ISBN: 978-0-7354-0432-8
Datum der Publikation: 2007
Ausgabe: 922
Seiten: 105-106
Kongress: 19th International Conference on Noise and Fluctuations
Art: Konferenz-Beitrag