A model for the generation recombination noise in junction field effect structures application to four-gate transistors

  1. Tejada, J. A. Jimenez
  2. Rodriguez, A. Luque
  3. Godoy, A.
Liburu bilduma:
NOISE AND FLUCTUATIONS
  1. Tacano, M (coord.)
  2. Yamamoto, Y (coord.)
  3. Nakao, M (coord.)

ISSN: 0094-243X

ISBN: 978-0-7354-0432-8

Argitalpen urtea: 2007

Alea: 922

Orrialdeak: 105-106

Biltzarra: 19th International Conference on Noise and Fluctuations

Mota: Biltzar ekarpena

GOOGLE SCHOLAR
Datuen iturria: WoS