A model for the generation recombination noise in junction field effect structures application to four-gate transistors

  1. Tejada, J. A. Jimenez
  2. Rodriguez, A. Luque
  3. Godoy, A.
Book Series:
NOISE AND FLUCTUATIONS
  1. Tacano, M (coord.)
  2. Yamamoto, Y (coord.)
  3. Nakao, M (coord.)

ISSN: 0094-243X

ISBN: 978-0-7354-0432-8

Year of publication: 2007

Volume: 922

Pages: 105-106

Congress: 19th International Conference on Noise and Fluctuations

Type: Conference paper

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Data source: WoS